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穿透型V形坑对GaN基p-i-n结构紫外探测器反向漏电的影响 期刊论文
物理学报, 2009, 卷号: 58, 期号: 11, 页码: 7952-7957
Authors:  张爽;  赵德刚;  刘宗顺;  朱建军;  张书明;  王玉田;  段俐宏;  刘文宝;  江德生;  杨辉
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Defect Cluster-Induced X-Ray Diffuse Scattering in GaN Films Grown by MOCVD 期刊论文
半导体学报, 2008, 卷号: 29, 期号: 7, 页码: 1242-1245
Authors:  Ma Zhifang;  Wang Yutian;  Jiang Desheng;  Zhao Degang;  Zhang Shuming;  Zhu Jianjun;  Liu Zongshun;  Sun Baojuan;  Duan Ruifei;  Yang Hui;  Liang Junwu
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Twinning in Low-Temperature MOCVD Grown GaN on (001) GaAs Substrate 期刊论文
半导体学报, 2005, 卷号: 26, 期号: 4, 页码: 645-650
Authors:  Shen Xiaoming;  Wang Yutian;  Wang Jianfeng;  Liu Jianping;  Zhang Jicai;  Guo Liping;  Jia Quanjie;  Jiang Xiaoming;  Hu Zhengfei;  Yang Hui;  Liang Junwu
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双异质外延Si/Al_2O_3/Si薄膜制作的CMOS器件 期刊论文
半导体学报, 2004, 卷号: 25, 期号: 7, 页码: 824-830
Authors:  昝育德;  王俊;  李瑞云;  韩秀峰;  王建华;  于芳;  刘忠立;  王玉田;  王占国;  林兰英
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In源流量与Ⅲ族流量之比对InGaN/GaN多量子阱性质的影响 期刊论文
物理学报, 2004, 卷号: 53, 期号: 8, 页码: 2467-2471
Authors:  张纪才;  王建峰;  王玉田;  杨辉
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缓冲层生长压力对MOCVD GaN性能的影响 期刊论文
中国科学. E辑, 技术科学, 2004, 卷号: 34, 期号: 0, 页码: 1
Authors:  陈俊;  张书明;  张宝顺;  朱建军;  冯淦;  段俐宏;  王玉田;  杨辉;  郑文琛
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GaN外延膜厚度的x射线双晶衍射测量 期刊论文
中国科学. G辑,物理, 2003, 卷号: 33, 期号: 2, 页码: 122-125
Authors:  冯淦;  朱建军;  沈晓明;  张宝顺;  赵德刚;  王玉田;  杨辉;  梁骏吾
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GaAs衬底生长的立方GaN晶片键合技术 期刊论文
中国科学. E辑,技术科学, 2002, 卷号: 32, 期号: 5, 页码: 584-589
Authors:  孙元平;  付羿;  渠波;  王玉田;  冯玉宏;  赵德刚;  郑新和;  段俐宏;  李秉臣;  张书明;  杨辉;  姜晓明;  郑文莉;  贾全杰
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GaN横向外延中晶面倾斜的形成机制 期刊论文
中国科学. A辑,数学, 2002, 卷号: 32, 期号: 8, 页码: 737-742
Authors:  冯淦;  郑新和;  朱建军;  沈晓明;  张宝顺;  赵德刚;  孙元平;  张泽洪;  王玉田;  杨辉;  梁骏吾
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横向外延GaN结晶质量的同步辐射研究 期刊论文
核技术, 2002, 卷号: 25, 期号: 10, 页码: 770-774
Authors:  冯淦;  郑新和;  王玉田;  杨辉;  梁骏吾;  郑文莉;  贾全杰
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