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Well-width dependence of the emission linewidth in ZnO/MgZnO quantum wells 期刊论文
NANOSCALE RESEARCH LETTERS, 2012, 卷号: 7, 页码: 605
Authors:  Lv XQ (Lv, Xue-Qin);  Zhang JY (Zhang, Jiang-Yong);  Ying LY (Ying, Lei-Ying);  Liu WJ (Liu, Wen-Jie);  Hu XL (Hu, Xiao-Long);  Zhang BP (Zhang, Bao-Ping);  Qui ZR (Qui, Zhi-Ren);  Kuboya S (Kuboya, Shigeyuki);  Onabe K (Onabe, Kentaro)
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High-reflectivity AlN/GaN distributed Bragg reflectors grown on sapphire substrates by MOCVD 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2011, 卷号: 26, 期号: 5, 页码: Article no.55013
Authors:  Wu CM;  Zhang BP;  Shang JZ;  Cai LE;  Zhang JY;  Yu JZ;  Wang QM;  Wu, CM, Xiamen Univ, Dept Phys, Lab Micro Nano Optoelect, Xiamen 361005, Peoples R China.
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Chemical-vapor-deposition  Molecular-beam Epitaxy  Phase Epitaxy  Mirrors  Gan  Wavelengths  
Resonant-cavity blue light-emitting diodes fabricated by two-step substrate transfer technique 期刊论文
ELECTRONICS LETTERS, 2011, 卷号: 47, 期号: 17, 页码: 986-U69
Authors:  Hu XL;  Zhang JY;  Liu WJ;  Chen M;  Zhang BP;  Xu BS;  Wang QM;  Hu, XL (reprint author), Xiamen Univ, Dept Phys, Lab Micro Nano Optoelect, Xiamen 361005, Fujian, Peoples R China. bzhang@xmu.edu.cn
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Gan  
The exciton-longitudinal-optical-phonon coupling in InGaN/GaN single quantum wells with various cap layer thicknesses 期刊论文
CHINESE PHYSICS B, 2010, 卷号: 19, 期号: 11, 页码: Art. No. 117801
Authors:  Hu XL (Hu Xiao-Long);  Zhang JY (Zhang Jiang-Yong);  Shang JZ (Shang Jing-Zhi);  Liu WJ (Liu Wen-Jie);  Zhang BP (Zhang Bao-Ping);  Zhang, BP, Xiamen Univ, Dept Phys, Lab Micronano Optoelect, Xiamen 361005, Peoples R China.
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Exciton-longitudinal-optical-phonon  Ingan/gan Single Quantum Well  Gan Cap Layer  Huang-rhys Factor  
Formation of high reflective Ni/Ag/Ti/Au contact on p-GaN 期刊论文
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2010, 卷号: 42, 期号: 9, 页码: 2420-2423
Authors:  Jiang F (Jiang Fang);  Cai LE (Cai Li-E);  Zhang JY (Zhang Jiang-Yong);  Zhang BP (Zhang Bao-Ping)
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High Reflective  P-gan  Aes  Optimal Conditions  
Impact of thickness of GaN buffer layer on properties of AlN/GaN distributed Bragg reflectors grown by metalorganic chemical vapor deposition 期刊论文
SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2010, 卷号: 53, 期号: 2, 页码: 313-316
Authors:  Wu CM (Wu ChaoMin);  Shang JZ (Shang JingZhi);  Zhang BP (Zhang BaoPing);  Zhang JY (Zhang JiangYong);  Yu JZ (Yu JinZhong);  Wang QM (Wang QiMing);  Zhang, BP, Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China. 电子邮箱地址: bzhang@xmu.edu.cn
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Mocvd  Dbr  High-reflectivity  Nitride  Surface-emitting Laser  
Improvement of efficiency droop of GaN-based light-emitting devices by a rear nitride reflector 期刊论文
PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2010, 卷号: 43, 期号: 1, 页码: 289-292
Authors:  Cai LE;  Zhang BP;  Zhang JY;  Wu CM;  Jiang F;  Hu XL;  Chen M;  Wang QM;  Zhang, BP, Xiamen Univ, Dept Phys, Lab Micro Nano Optoelect, Xiamen 361005, Peoples R China. bzhang@xmu.edu.cn
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Diodes  
Substantial photo-response of InGaN p-i-n homojunction solar cells 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 5, 页码: Art. No. 055009
Authors:  Zeng SW;  Zhang BP;  Sun JW;  Cai JF;  Chen C;  Yu JZ;  Zhang BP Xiamen Univ Dept Phys Xiamen 361005 Fujian Peoples R China. E-mail Address: bzhang@xmu.edu.cn
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Fundamental-band Gap  Inn  Absorption  Alloys  Energy  
Efficient hole transport in asymmetric coupled InGaN multiple quantum wells 期刊论文
APPLIED PHYSICS LETTERS, 2009, 卷号: 95, 期号: 16, 页码: Art.No.161110
Authors:  Zhang JY (Zhang Jiang-Yong);  Cai LE (Cai Li-E);  Zhang BP (Zhang Bao-Ping);  Hu XL (Hu Xiao-Long);  Jiang F (Jiang Fang);  Yu JZ (Yu Jin-Zhong);  Wang QM (Wang Qi-Ming);  Zhang, JY, Chinese Acad Sci, State Key Lab Integrated Optoelect, Inst Semicond, Beijing 100083, Peoples R China. 电子邮箱地址: bzhang@xmu.edu.cn;  qmwang@semi.ac.cn
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Growth behavior of AlInGaN films 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2009, 卷号: 311, 期号: 3, 页码: 474-477
Authors:  Shang JZ;  Zhang BP;  Mao MH;  Cai LE;  Zhang JY;  Fang ZL;  Liu BL;  Yu JZ;  Wang QM;  Kusakabe K;  Ohkawa K;  Zhang BP Xiamen Univ Dept Phys Xiamen 361005 Peoples R China. E-mail Address: bzhang@xmu.edu.cn
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Scanning Electron Microscope  Strain  X-ray Diffraction  Alingan