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Dependence of ultra-thin gate oxide reliability on surface cleaning approach 会议论文
1998 5TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, OCT 21-23, 1998
作者:  Gao WY;  Liu ZL;  He ZJ;  Gao WY Chinese Acad Sci Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(259Kb)  |  收藏  |  浏览/下载:1338/429  |  提交时间:2010/10/29
Chemical Treatment  Quality  Technology  Films  
Design and fabrication of GaAs OMIST photodetector 会议论文
INTEGRATED OPTOELECTRONICS II, 3551, BEIJING, PEOPLES R CHINA, SEP 18-19, 1998
作者:  Kang XJ;  Lin SM;  Liao QW;  Gao JH;  Liu SA;  Cheng P;  Wang HJ;  Zhang CH;  Wang QM;  Kang XJ Acad Sinica Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(138Kb)  |  收藏  |  浏览/下载:1685/479  |  提交时间:2010/10/29
Photodetector  Oxidation  Materials Growth  
The enhancement of spontaneous emission factor in selectively oxidized vertical cavity lasers with double oxide layers 会议论文
SEMICONDUCTOR LASERS III, 3547, BEIJING, PEOPLES R CHINA, SEP 16-18, 1998
作者:  Huang YZ;  Huang YZ Chinese Acad Sci Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(350Kb)  |  收藏  |  浏览/下载:1154/357  |  提交时间:2010/10/29
Vertical-cavity Lasers  Spontaneous Emission Factor  Laser Modes  Alas Oxidation  
Visible vertical cavity surface emitting laser 会议论文
SEMICONDUCTOR LASERS III, 3547, BEIJING, PEOPLES R CHINA, SEP 16-18, 1998
作者:  Cheng P;  Ma XY;  Gao JH;  Kang XJ;  Cao Q;  Wang HJ;  Luo LP;  Zhang CH;  Lu XL;  Lin SM;  Cheng P Acad Sinica Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(469Kb)  |  收藏  |  浏览/下载:1405/385  |  提交时间:2010/10/29
Semiconductor Lasers  Oxidation  
Stability improvement of selective oxidation during the fabrication of InGaAs/GaAs vertical cavity surface emitting laser 会议论文
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 37 (6B), TOKYO, JAPAN, OCT 07-09, 1997
作者:  Pan Z;  Zhang Y;  Du Y;  Wu RH;  Pan Z Tokyo Inst Technol Precis & Intelligence Lab Midori Ku 4259 Nagatsuta Yokohama Kanagawa 2268503 Japan.
Adobe PDF(465Kb)  |  收藏  |  浏览/下载:1139/257  |  提交时间:2010/11/15
Vcsel  Selective Oxidation  Stability  Wet Oxidation  Microstructure