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Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406 会议论文
SEMICONDUCTOR LASERS AND APPLICATIONS III, Beijing, PEOPLES R CHINA, NOV 12-13, 2007
作者:  Liu, J;  Zhang, SJ;  Hu, YH;  Xie, L;  Huang, YZ;  Zhu, NH;  Liu, J, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Adobe PDF(338Kb)  |  收藏  |  浏览/下载：1357/314  |  提交时间：2010/03/09
Semiconductor Optical Amplifier  Microwave Frequency Response  Direct-subtracting Method  Vector Network Analyzer  Multisectional Model  Rate Equation  Steady State  Small-signal State  
Defects in GaSb studied by coincidence Doppler broadening measurements 会议论文
POSITRON ANNIHILATION, ICPA-13, PROCEEDINGS, 445-6, Kyoto, JAPAN, SEP 07-12, 2003
作者:  Hu WG;  Wang Z;  Dai YQ;  Wang SJ;  Zhao YW;  Hu WG Wuhan Univ Dept Phys Wuhan 430072 Peoples R China. 电子邮箱地址: wangz@whu.edu.cn
Adobe PDF(210Kb)  |  收藏  |  浏览/下载：1326/262  |  提交时间：2010/10/29
Coincidence Doppler Broadening  Defects  Gasb  Positron Annihilation