Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406
	Liu, J; Zhang, SJ; Hu, YH; Xie, L; Huang, YZ; Zhu, NH; Liu, J, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
	2008
会议名称	Conference on Semiconductor Lasers and Applications III
会议录名称	SEMICONDUCTOR LASERS AND APPLICATIONS III
页码	6824: 82406-82406
会议日期	NOV 12-13, 2007
会议地点	Beijing, PEOPLES R CHINA
出版地	1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
出版者	SPIE-INT SOC OPTICAL ENGINEERING
ISSN	0277-786X
ISBN	978-0-8194-6999-1
部门归属	[liu, jian; hu, yong-hong; xie, liang; huang, yong-zhen; zhu, ning-hua] chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
摘要	The measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (SOAs) are proposed in this paper. The response is measured using a vector network analyzer. Then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the SOA is extracted. Some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. The multisectional model of an SOA is then used to analyze the response theoretically. By deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. Then by iterating the expression, the response of the whole SOA is simulated. The simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. This proves the validity of the theoretical analysis.
关键词	Semiconductor Optical Amplifier Microwave Frequency Response Direct-subtracting Method Vector Network Analyzer Multisectional Model Rate Equation Steady State Small-signal State
学科领域	光电子学
主办者	SPIE.; Chinese Opt Soc.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/7852
专题	中国科学院半导体研究所（2009年前）
通讯作者	Liu, J, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
推荐引用方式 GB/T 7714	Liu, J,Zhang, SJ,Hu, YH,et al. Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2008:6824: 82406-82406.

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