An Ultra Low Power Non-volatile Memory in Standard CMOS Process for Passive RFID Tags
Feng P (Feng Peng); Li YL (Li Yunlong); Wu NJ (Wu Nanjian); Feng, P, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China. E-mail Address: nanjian@red.semi.ac.cn
2009
会议名称THE IEEE 2009 CUSTOM INTEGRATED CIRCUITS CONFERENCE
会议录名称PROCEEDINGS OF THE IEEE 2009 CUSTOM INTEGRATED CIRCUITS CONFERENCE: 713-716 2009
页码713-716
会议日期2009
会议地点San Jose, CA
合作性质其它
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
出版者IEEE
ISBN978-1-4244-4072-6
摘要An ultra low power non-volatile memory is designed in a standard CMOS process for passive RFID tags. The memory can operate in a new low power operating scheme under a wide supply voltage and clock frequency range. In the charge pump circuit the threshold voltage effect of the switch transistor is almost eliminated and the pumping efficiency of the circuit is improved. An ultra low power 192-bit memory with a register array is implemented in a 0.18 mu M standard CMOS process. The measured results indicate that, for the supply voltage of 1.2 volts and the clock frequency of 780KHz, the current consumption of the memory is 1.8 mu A (3.6 mu A) at the read (write) rate of 1.3Mb/s (0.8Kb/s).
学科领域微电子学
主办者IEEE Solid State Circuits Soc.; IEEE Electron Decices Soc.
收录类别CPCI(ISTP)
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/11144
专题中国科学院半导体研究所(2009年前)
通讯作者Feng, P, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China. E-mail Address: nanjian@red.semi.ac.cn
推荐引用方式
GB/T 7714
Feng P ,Li YL ,Wu NJ ,et al. An Ultra Low Power Non-volatile Memory in Standard CMOS Process for Passive RFID Tags[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2009:713-716.
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