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Gate Leakage and Breakdown Characteristics of AlGaN/GaN High-Electron-Mobility Transistors with Fe Delta-Doped Buffer 期刊论文
NANOSCIENCE AND NANOTECHNOLOGY LETTERS, 2018, 卷号: 10, 期号: 2, 页码: 185-189
Authors:  Meilan Hao ;   Quan Wang ;   Lijuan Jiang ;   Chun Feng ;   Changxi Chen ;   Cuimei Wang ;   Hongling Xiao ;   Fengqi Liu ;   Xiangang Xu ;   Xiaoliang Wang ;   Zhanguo Wang
Adobe PDF(2912Kb)  |  Favorite  |  View/Download:75/0  |  Submit date:2019/11/15
AlGaN/GaN HEMT 功率开关器件漏电与陷阱效应研究 学位论文
, 北京: 中国科学院研究生院, 2016
Authors:  郝美兰
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