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Analysis of the ohmic contacts of Ti/Al/Ni/Au to AlGaN/GaN HEMTs by the multi-step annealing process 期刊论文
Journal of Semiconductors, 2012, 卷号: 33, 期号: 6, 页码: 064005
Authors:  Yan, Wei;  Zhang, Renping;  Du, Yandong;  Han, Weihua;  Yang, Fuhua
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