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Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406 会议论文
SEMICONDUCTOR LASERS AND APPLICATIONS III, Beijing, PEOPLES R CHINA, NOV 12-13, 2007
作者:  Liu, J;  Zhang, SJ;  Hu, YH;  Xie, L;  Huang, YZ;  Zhu, NH;  Liu, J, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Adobe PDF(338Kb)  |  收藏  |  浏览/下载:1375/314  |  提交时间:2010/03/09
Semiconductor Optical Amplifier  Microwave Frequency Response  Direct-subtracting Method  Vector Network Analyzer  Multisectional Model  Rate Equation  Steady State  Small-signal State  
Subtraction of S-parameters for adiabatic small-signal modulation characteristics of laser diode - art. no. 60201V 会议论文
Optoelectronic Materials and Devices for Optical Communications丛书标题: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), Shanghai, PEOPLES R CHINA, NOV 07-10, 2005
作者:  Zhang, SJ;  Wen, JM;  Song, HP;  Zhu, NH;  Zhang, SJ, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Adobe PDF(287Kb)  |  收藏  |  浏览/下载:1394/423  |  提交时间:2010/03/29
Semiconductor Laser Diode  Subtraction Method  Scattering Parameters  Intrinsic Response  Thermal Effect  Frequency-response  
Choice of calibration equations of the TSM method 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Wang YL;  Chen ZY;  Zhu NH;  Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(205Kb)  |  收藏  |  浏览/下载:1066/276  |  提交时间:2010/10/29
Calibration  Network Analyzer  Frequency Limitation  Scattering-parameter Measurement  Network-analyzer Calibration  Test Fixtures  
Frequency limitation in calibrating microwave test fixtures 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Qian C;  Wang YL;  Chen ZY;  Zhu NH;  Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(217Kb)  |  收藏  |  浏览/下载:1187/222  |  提交时间:2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration