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中国科学院半导体研究所机构知识库
Knowledge Management System Of Institute of Semiconductors,CAS
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Source Publication：ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 5188
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Single steady frequency and narrow line width external cavity semiconductor laser
会议论文
ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 5188, SAN DIEGO, CA, AUG 03-05, 2003
Authors:
Zhao WR
;
Jiang PF
;
Xie FZ
;
Zhao WR Chinese Acad Sci Inst Semicond Beijing 100083 Peoples R China.
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Submit date：2010/10/29
External Cavity Semiconductor Laser
Light Feedback
Single Longitudinal Mode
Spectral Line Width
Feedback
Diode
