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Defect influence on luminescence efficiency of GaN-based LEDs 会议论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Beijing, PEOPLES R CHINA, SEP 13-19, 2005
作者:  Li SP (Li Shuping);  Fang ZL (Fang Zhilai);  Chen HY (Chen Hangyang);  Li JC (Li Jinchai);  Chen XH (Chen Xiaohong);  Yuan XL (Yuan Xiaoli);  Sekiguchi T (Sekiguchi Takashi);  Wang QM (Wang Qiming);  Kang JY (Kang Junyong);  Kang, JY, Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China. 电子邮箱地址: jykang@xmu.edu.cn
Adobe PDF(142Kb)  |  收藏  |  浏览/下载：1375/288  |  提交时间：2010/03/29
Defects  
Simulation of a monolithically integrated CMOS bioamplifier for EEG recordings 会议论文
2005 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS丛书标题: IEEE Conference on Electron Devices and Solid-State Circuits, Kowloon, PEOPLES R CHINA, DEC 19-21, 2005
作者:  Sui XH (Sui Xiaohong);  Liu JB (Liu Jinbin);  Gu M (Gu Ming);  Pei WH (Pei Weihua);  Chen HD (Chen Hongda);  Sui, XH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Adobe PDF(1158Kb)  |  收藏  |  浏览/下载：2082/744  |  提交时间：2010/03/29
Amplifier