SEMI OpenIR

浏览/检索结果: 共10条,第1-10条 帮助

已选(0)清除 条数/页:   排序方式:
无权访问的条目 期刊论文
作者:  Silvonen K;  Zhu NH;  Liu Y;  Silvonen, K, Helsinki Univ Technol, Circuit Theory Lab, FIN-02015 Helsinki, Finland. E-mail: kimmo.silvonen@tkk.fi;  nhzhu@red.semi.ac.cn;  yliusemi@hotmail.com
Adobe PDF(301Kb)  |  收藏  |  浏览/下载:1110/451  |  提交时间:2010/04/11
无权访问的条目 期刊论文
作者:  Zhu NH;  Qian C;  Wang YL;  Pun EYB;  Chung PS;  Zhu NH,Chinese Acad Sci,Inst Semicond,State Key Lab Integrated Optoelect,Beijing 100083,Peoples R China.
Adobe PDF(469Kb)  |  收藏  |  浏览/下载:1034/273  |  提交时间:2010/08/12
Two-port calibration of test fixtures with OSL method. 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Chen ZY;  Wang YL;  Liu Y;  Zhu NH;  Chen ZY CAS Inst Semicond State Key Lab Integrated Optoelect Beijing 100083 Peoples R China.
Adobe PDF(212Kb)  |  收藏  |  浏览/下载:1709/408  |  提交时间:2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration  Line  
Choice of calibration equations of the TSM method 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Wang YL;  Chen ZY;  Zhu NH;  Wang YL CAS Inst Semicond State Key Lab Integrated Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(205Kb)  |  收藏  |  浏览/下载:1337/276  |  提交时间:2010/10/29
Calibration  Network Analyzer  Frequency Limitation  Scattering-parameter Measurement  Network-analyzer Calibration  Test Fixtures  
Frequency limitation in calibrating microwave test fixtures 会议论文
2002 3RD INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, AUG 17-19, 2002
作者:  Qian C;  Wang YL;  Chen ZY;  Zhu NH;  Qian C CAS State Key Lab Integrated Optoelect Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(217Kb)  |  收藏  |  浏览/下载:1351/222  |  提交时间:2010/10/29
Calibration  Microwave Network Analyzer  Scattering-parameter Measurement  Phase Uncertainty  Network-analyzer Calibration  
无权访问的条目 期刊论文
作者:  Zhen YC;  You LW;  Yu L;  Ning HZ;  Zhen YC,Chinese Acad Sci,Inst Semicond,State Key Lab Integrated Optoelect,Beijing 100083,Peoples R China.
Adobe PDF(143Kb)  |  收藏  |  浏览/下载:718/221  |  提交时间:2010/08/12
无权访问的条目 期刊论文
作者:  Zhu NH;  Liu Y;  Pun EYB;  Chung PS;  Zhu NH,Chinese Acad Sci,Inst Semicond,Natl Res Ctr Optoelect Technol,State Key Lab Integrated Optoelect,POB 912,Beijing 100083,Peoples R China.
Adobe PDF(306Kb)  |  收藏  |  浏览/下载:1030/401  |  提交时间:2010/08/12
无权访问的条目 期刊论文
作者:  Zhu NH;  Chen ZY;  Wang YL;  Zhu NH,Chinese Acad Sci,Inst Semicond,State Key Lab Integrated Optoelect,POB 912,Beijing 100083,Peoples R China.
Adobe PDF(245Kb)  |  收藏  |  浏览/下载:1285/233  |  提交时间:2010/08/12
无权访问的条目 期刊论文
作者:  Zhu NH;  Auracher F;  Zhu NH,Chinese Acad Sci,Inst Semicond,Beijing 100083,Peoples R China.
Adobe PDF(192Kb)  |  收藏  |  浏览/下载:685/235  |  提交时间:2010/08/12
无权访问的条目 期刊论文
作者:  Zhu NH;  Zhu NH,Chinese Acad Sci,Inst Semicond,Beijing 100083,Peoples R China.
Adobe PDF(164Kb)  |  收藏  |  浏览/下载:1290/530  |  提交时间:2010/08/12