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Investigation of vertical radiation loss for whispering-gallery modes in 3-D microresonators by FDTD simulation | |
Yang YD (Yang Yue-De); Huang YZ (Huang Yong-Zhen); Chen Q (Chen Qin); Yang, YD, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. | |
2007 | |
会议名称 | 9th International Conference on Transparent Optical Networks (ICTON 2007) |
会议录名称 | ICTON 2007 Proceedings of the 9th International Conference on Transparent Optical Networks |
页码 | Vol 3: 87-90 |
会议日期 | JUL 01-05, 2007 |
会议地点 | Rome, ITALY |
出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA |
出版者 | IEEE |
部门归属 | chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china |
摘要 | The vertical radiation loss of three-dimensional (3-D) microresonators is investigated by 3-D finite-difference time-domain (FDTD) simulation. The simulation shows that the vertical radiation causes an important loss in the microresonators with weak waveguiding, and result in decrease of the quality factors (Q-factors) of whispering-gallery (WG) modes. Through the simulation, we find that TM-like modes have much weaker vertical radiation loss than TE-like modes. High Q-factor TM-like modes are observed in the 3-D microresonators with weak vertical waveguiding, but the Q-factors of TE-like modes decrease greatly. |
关键词 | Microresonators |
学科领域 | 光电子学 |
主办者 | IEEE.; IEEE Laser & Electro Opt Soc.; IEEE/LEOS Poland Chapter.; COST.; Instytut Lacznosci.; iscom.; IT.; Univ Degli Studio, Roma Tor Vergata.; Univ Degli Studio, ROMA TRE.; Inst Supenore Antinicendi.; e-Photon ONe. |
收录类别 | 其他 |
语种 | 英语 |
文献类型 | 会议论文 |
条目标识符 | http://ir.semi.ac.cn/handle/172111/9840 |
专题 | 中国科学院半导体研究所(2009年前) |
通讯作者 | Yang, YD, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. |
推荐引用方式 GB/T 7714 | Yang YD ,Huang YZ ,Chen Q ,et al. Investigation of vertical radiation loss for whispering-gallery modes in 3-D microresonators by FDTD simulation[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2007:Vol 3: 87-90. |
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