A new frequency offset estimation for OFDM-based systems

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	A new frequency offset estimation for OFDM-based systems
	Zhi, F (Fang, Zhi); Xiao, WN (Xiao, Wanang); Shi, Y (Shi, Yin); Zhi, F, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China.
	2006
Conference Name	1st IEEE Conference on Industrial Electronics and Applications (ICIEA 2006)
Source Publication	2006 1st IEEE Conference on Industrial Electronics and Applications
Pages	Vols 1-3: 985-988
Conference Date	MAY 24-26, 2006
Conference Place	Singapore, SINGAPORE
Publication Place	345 E 47TH ST, NEW YORK, NY 10017 USA
Publisher	IEEE
ISBN	978-0-7803-9513-8
metadata_83	chinese acad sci, inst semicond, beijing 100083, peoples r china
Abstract	A new carrier frequency offset estimation scheme in orthogonal frequency division multiplexing (OFDM) is proposed. The scheme includes coarse frequency offset estimation and fine frequency offset estimation. The coarse frequency offset estimation method we present is a improvement of Zhang's method. The estimation range of the new method is as large as the overall signal-band width. A new fine frequency offset estimation algorithm is also discussed in this paper. The new algorithm has a better performance than the Schmidl's algorithm. The system we use to calculate and simulate is based on the high rate WLAN standard adopted by the IEEE 802.11 stanidardization group. Numerical results are presented to demonstrate the performance of the proposed algorithm.
Subject Area	人工智能
Funding Organization	IEEE Ind Elect Chapter.; IEEE Ind Applicat/Power Elect Chapter.; IEEE Singapore Sect.; IEEE Ind Elect Soc.
Indexed By	CPCI-S
Language	英语
Document Type	会议论文
Identifier	http://ir.semi.ac.cn/handle/172111/9772
Collection	中国科学院半导体研究所（2009年前）
Corresponding Author	Zhi, F, Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China.
Recommended Citation GB/T 7714	Zhi, F ,Xiao, WN ,Shi, Y ,et al. A new frequency offset estimation for OFDM-based systems[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2006:Vols 1-3: 985-988.

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