Low Power Integrated Circuits for Wireless Neural Recording Applications
Zhang X; Pei WH; Gui Q; Chen HD; Zhang, X, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
2008
会议名称IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)
会议录名称2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008)
页码VOLS 1-4: 650-653
会议日期NOV 30-DEC 03, 2008
会议地点Macao, PEOPLES R CHINA
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
出版者IEEE
ISBN978-1-4244-2341-5
部门归属[zhang, xu; pei, weihua; gui, qiang; chen, hongda] chinese acad sci, inst semicond, state key lab integrated optoelect, beijing 100083, peoples r china
摘要A group of prototype integrated circuits are presented for a wireless neural recording micro-system. An inductive link was built for transcutaneous wireless power transfer and data transmission. Power and data were transmitted by a pair of coils on a same carrier frequency. The integrated receiver circuitry was composed of a full-wave bridge rectifier, a voltage regulator, a date recovery circuit, a clock recovery circuit and a power detector. The amplifiers were designed with a limited bandwidth for neural signals acquisition. An integrated FM transmitter was used to transmit the extracted neural signals to external equipments. 16.5 mW power and 50 bps - 2.5 Kbps command data can be received over 1 MHz carrier within 10 mm. The total gain of 60 dB was obtained by the preamplifier and a main amplifier at 0.95Hz - 13.41 KHz with 0.215 mW power dissipation. The power consumption of the 100 MHz ASK transmitter is 0.374 mW. All the integrated circuits operated under a 3.3 V power supply except the voltage regulator.
关键词System
学科领域微电子学
主办者IEEE.
收录类别其他
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/8248
专题中国科学院半导体研究所(2009年前)
通讯作者Zhang, X, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
推荐引用方式
GB/T 7714
Zhang X,Pei WH,Gui Q,et al. Low Power Integrated Circuits for Wireless Neural Recording Applications[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2008:VOLS 1-4: 650-653.
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