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SEMI OpenIR  > 中国科学院半导体研究所（2009年前）
GaAs基半导体量子点激光器管芯质量的检测和分析方法
梁凌燕; 叶小玲; 徐波; 陈涌海; 王占国
2008-07-02
Date Available2009-06-04 ; 2009-06-11
Subtype发明
Application Date2006-12-28
Language中文
Application Number200610169748
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/4093
Collection中国科学院半导体研究所（2009年前）
Recommended Citation
GB/T 7714		 梁凌燕,叶小玲,徐波,等. GaAs基半导体量子点激光器管芯质量的检测和分析方法[P]. 2008-07-02.
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