SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
基于微控制器和CPLD的高速动态测试装置及方法
肖宛昂; 石寅
2007-10-24
Date Available2009-06-04 ; 2009-06-11
Subtype发明
Application Date2006-04-17
Language中文
Application Number200610066657
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/3881
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
肖宛昂,石寅. 基于微控制器和CPLD的高速动态测试装置及方法[P]. 2007-10-24.
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