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SEMI OpenIR  > 中国科学院半导体研究所（2009年前）
光电容法确定半导体量子点电荷密度的方法
李桂荣; 郑厚植; 杨富华
2007-02-21
Date Available2009-06-04 ; 2009-06-11
Subtype发明
Application Date2005-08-18
Language中文
Application Number200510090641
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/3619
Collection中国科学院半导体研究所（2009年前）
Recommended Citation
GB/T 7714		 李桂荣,郑厚植,杨富华. 光电容法确定半导体量子点电荷密度的方法[P]. 2007-02-21.
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200510090641.pdf（420KB） 限制开放--Application Full Text
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