SEMI OpenIR  > 半导体超晶格国家重点实验室
基于高速图像传感器和并行处理的视觉检测系统
杨永兴; 吴南健; 石匆; 杨杰
Rights Holder中国科学院半导体研究所
Date Available2014-01-29
Country中国
Subtype发明
Subject Area半导体物理
Application Date2013-10-22
Application NumberCN201310498720.0
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25508
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
杨永兴,吴南健,石匆,等. 基于高速图像传感器和并行处理的视觉检测系统.
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