High-quality metamorphic HEMT grown on GaAs substrates by MBE
Zeng YP; Cao X; Cui LJ; Kong MY; Pan L; Wang BQ; Zhu ZP; Cao X Chinese Acad Sci Inst Semicond POB 912 Beijing 100083 Peoples R China.
2001
会议名称11th International Conference on Molecular Beam Epitaxy (MBE-XI)
会议录名称JOURNAL OF CRYSTAL GROWTH, 227
页码210-213
会议日期SEP 11-15, 2000
会议地点BEIJING, PEOPLES R CHINA
出版地PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
出版者ELSEVIER SCIENCE BV
ISSN0022-0248
部门归属chinese acad sci, inst semicond, beijing 100083, peoples r china
摘要Metamorphic high electron mobility transistor (M-HEMT) structures have been grown on GaAs substrates by molecular beam epitaxy (MBE). Linearly graded and the step-graded InGaAs and InAlAs buffet layers hal e been compared, and TEM, PL and low-temperature Hall have been used to analyze the properties of the buffer layers and the M-HEMT structure. For a single-delta-doped M-HEMT structure with an In0.53Ga0.47As channel layer and a 0.8 mum step-graded InAlAs buffer layer, room-temperature mobility of 9000 cm(2)/V s and a sheet electron density as high as 3.6 x 10(12)/cm(2) are obtained. These results are nearly equivalent to those obtained for the same structure grown on an InP substrate. A basic M-HEMT device with 1 mum gate was fabricated, and g(m) is larger than 400 mS/mm. (C) 2001 Elsevier Science B.V. All rights reserved.
关键词Molecular Beam Epitaxy High Electron Mobility Transistors Density
学科领域半导体材料
主办者China Natl Nat Sci Fdn.; Inst Semiconductor, CAS.; Inst Phys, CAS.; State Key Lab Funct Mat Informat.; Inst Met, CAS.; Hong Kong Univ Sci & Technol.; Univ Hong Kong, Lab New Mat.; Chinese Acad Sci, Lab New Mat.; VG Semicon.; Riber.
收录类别CPCI-S
语种英语
文献类型会议论文
条目标识符http://ir.semi.ac.cn/handle/172111/14931
专题中国科学院半导体研究所(2009年前)
通讯作者Cao X Chinese Acad Sci Inst Semicond POB 912 Beijing 100083 Peoples R China.
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Zeng YP,Cao X,Cui LJ,et al. High-quality metamorphic HEMT grown on GaAs substrates by MBE[C]. PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS:ELSEVIER SCIENCE BV,2001:210-213.
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