Knowledge Management System Of Institute of Semiconductors,CAS
Defect influence on luminescence efficiency of GaN-based LEDs | |
Li SP (Li Shuping); Fang ZL (Fang Zhilai); Chen HY (Chen Hangyang); Li JC (Li Jinchai); Chen XH (Chen Xiaohong); Yuan XL (Yuan Xiaoli); Sekiguchi T (Sekiguchi Takashi); Wang QM (Wang Qiming); Kang JY (Kang Junyong); Kang, JY, Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China. 电子邮箱地址: jykang@xmu.edu.cn | |
2006 | |
Conference Name | 11th Conference on Defects Recognition Imaging and Physics in Semiconductors |
Source Publication | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING |
Pages | 9 (1-3): 371-374 |
Conference Date | SEP 13-19, 2005 |
Conference Place | Beijing, PEOPLES R CHINA |
Publication Place | THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND |
Publisher | ELSEVIER SCI LTD |
ISSN | 1369-8001 |
metadata_83 | xiamen univ, dept phys, xiamen 361005, peoples r china; xiamen univ, semicond photon res ctr, xiamen 361005, peoples r china; natl inst mat sci, tsukuba, ibaraki, japan; chinese acad sci, inst semicond, beijing 100864, peoples r china |
Abstract | Wafers with normal light-emitting diode structure were grown by metal organic chemical vapor deposition system. The pressure and temperature were varied during growth of buffer layer in order to grow different types of epilayers. The cathodoluminescence results show that the interface distortion of quantum well plays an important role in radiant efficiency. The electroluminescence detections indicate that the dislocations also influence the external quantum efficiency by lowering the electron injection efficiency. (c) 2006 Elsevier Ltd. All rights reserved. |
Keyword | Defects |
Subject Area | 光电子学 |
Indexed By | CPCI(ISTP) |
Language | 英语 |
Document Type | 会议论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/10004 |
Collection | 中国科学院半导体研究所(2009年前) |
Corresponding Author | Kang, JY, Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China. 电子邮箱地址: jykang@xmu.edu.cn |
Recommended Citation GB/T 7714 | Li SP ,Fang ZL ,Chen HY ,et al. Defect influence on luminescence efficiency of GaN-based LEDs[C]. THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND:ELSEVIER SCI LTD,2006:9 (1-3): 371-374. |
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