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Accurate vibration detection of a rough surface - art. no. 683118 会议论文
NANOPHOTONICS,NANOSTRUCTURE,AND NANOMETROLOGY II, Beijing, PEOPLES R CHINA, NOV 12-14, 2007
作者:  Zeng, HL;  Zhou, Y;  Fan, ST;  He, J;  Zeng, HL, Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China.
Adobe PDF(218Kb)  |  收藏  |  浏览/下载：1559/372  |  提交时间：2010/03/09
Measurement Of Microvibration  Nanometrology  Interferometry  Vibration Detection  
Nano-layer structure of silicon-on-insulator materials 会议论文
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 42, SEOUL, SOUTH KOREA, AUG 20-23, 2002
作者:  Wang X;  Chen M;  Chen J;  Dong YN;  Liu XH;  He P;  Tian LL;  Liu ZL;  Chen J Chinese Acad Sci Shanghai Inst Microsyst & Informat Technol Ion Beam Lab 865 Changning Rd Shanghai 200050 Peoples R China.
Adobe PDF(1181Kb)  |  收藏  |  浏览/下载：1179/242  |  提交时间：2010/11/15
Soi  Nanostructure  Microelectronic Materials  
Structural properties of polycrystalline silicon films formed by pulsed rapid thermal processing 会议论文
AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 507, SAN FRANCISCO, CA, APR 14-17, 1998
作者:  Wang YQ;  Liao XB;  Diao HW;  He J;  Ma ZX;  Yue GZ;  Shen SR;  Kong GL;  Zhao YW;  Li ZM;  Yun F;  Wang YQ Chinese Acad Sci Inst Semicond State Lab Surface Phys POB 912 Beijing 100083 Peoples R China.
Adobe PDF(958Kb)  |  收藏  |  浏览/下载：1171/287  |  提交时间：2010/10/29
Amorphous-silicon  Crystallization  Transistors  
The photon scanning tunneling microscope and its applications 会议论文
JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 15 (4), GUANGZHOU, PEOPLES R CHINA, AUG 29-SEP 02, 1995
作者:  Yao JE;  Guo N;  Gao S;  Wu SF;  Xia DK;  Shang GY;  Chu SC;  Li CJ;  He J;  Xu SH;  Yao JE Acad Sinica Beijing Lab Electron Microscopy POB 2724 Beijing 100080 Peoples R China.
Adobe PDF(1203Kb)  |  收藏  |  浏览/下载：1161/177  |  提交时间：2010/11/15
Photon Scanning Tunneling Microscope  Scanning Near-field Optical Microscope  Optical Microscopy