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Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 91, RIMINI, ITALY, SEP 24-28, 2001
作者:  Zhao YW;  Sun NF;  Dong HW;  Jiao JH;  Zhao JQ;  Sun TN;  Lin LY;  Sun NF Hebei Semicond Res Inst POB 179-40 Shijiazhuang 050002 Hebei Peoples R China.
Adobe PDF(179Kb)  |  收藏  |  浏览/下载：1584/289  |  提交时间：2010/11/15
Indium Phosphide  Semi-insulating  Annealing  Picts  Photoluminescence  Semiinsulating Inp  Indium-phosphide  Fe  Photoluminescence  Temperature  
Determination of the interdiffusion coefficients of liquid Zn and Sn using Ta/Zn-Sn/Si trilayers 会议论文
DIFFUSIONS IN MATERIALS: DIMAT2000, PTS 1 & 2, 194-1, PARIS, FRANCE, JUL 17-21, 2000
作者:  Wang WK;  Zhao JH;  Wang WK Chinese Acad Sci Inst Phys POB 60334 Beijing 100080 Peoples R China.
Adobe PDF(237Kb)  |  收藏  |  浏览/下载：829/144  |  提交时间：2010/11/15
Convection-less Condition  Liquid Metal Diffusion  Solid/liquid-liquid/solid Trilayer  
Circular crating optical scanning holography 会议论文
DIFFRACTIVE/HOLOGRAPHIC TECHNOLOGIES AND SPATIAL LIGHT MODULATORS VII, 3951, SAN JOSE, CA, JAN 24-25, 2000
作者:  Liang WG;  Liu SY;  Xie JH;  Zhao DZ;  Liang WG Acad Sinica Inst Semicond Natl Engn Res Ctr Optoelect Devices POB 912 Beijing 100083 Peoples R China.
Adobe PDF(218Kb)  |  收藏  |  浏览/下载：1180/307  |  提交时间：2010/10/29
Circular Grating  Scanning  Holography  Simulation  
Strain relaxation of GeSi alloy with low dislocation density grown on low-temperature Si buffers 会议论文
JOURNAL OF CRYSTAL GROWTH, 201, CANNES, FRANCE, AUG 31-SEP 04, 1998
作者:  Peng CS;  Chen H;  Zhao ZY;  Li JH;  Dai DY;  Huang Q;  Zhou JM;  Zhang YH;  Tung CH;  Sheng TT;  Wang J;  Peng CS Chinese Acad Sci Inst Phys POB 603 Beijing 100080 Peoples R China.
Adobe PDF(208Kb)  |  收藏  |  浏览/下载：1460/311  |  提交时间：2010/11/15
Threading Dislocation  Si(100)  Layers  Films