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The investigation on strain relaxation and double peaks in photoluminescence of InGaN/GaN MQW layers 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2009, 卷号: 42, 期号: 23, 页码: Art.No.235104
Authors:  Zhu, JH (Zhu, J. H.);  Wang, LJ (Wang, L. J.);  Zhang, SM (Zhang, S. M.);  Wang, H (Wang, H.);  Zhao, DG (Zhao, D. G.);  Zhu, JJ (Zhu, J. J.);  Liu, ZS (Liu, Z. S.);  Jiang, DS (Jiang, D. S.);  Qiu, YX (Qiu, Y. X.);  Yang, H (Yang, H.);  Zhu, JH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. 电子邮箱地址: smzhang@red.semi.ac.cn
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Multiple-quantum Wells  
Rapid thermal annealing properties of ZnO films grown using methanol as oxidant 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2007, 卷号: 40, 期号: 19, 页码: 6010-6013
Authors:  Zhang PF (Zhang, P. F.);  Liu XL (Liu, X. L.);  Wei HY (Wei, H. Y.);  Fan HB (Fan, H. B.);  Liang ZM (Liang, Z. M.);  Jin P (Jin, P.);  Yang SY (Yang, S. Y.);  Jiao CM (Jiao, C. M.);  Zhu QS (Zhu, Q. S.);  Wang ZG (Wang, Z. G.);  Zhang, PF, Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 100083, Peoples R China. 电子邮箱地址: zhangpanf@semi.ac.cn;  xlliu@semi.ac.cn
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Chemical-vapor-deposition  
Combined structure of ZnO vertical well-aligned nanorods and net-like structures on AIN/sapphire 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2007, 卷号: 306, 期号: 1, 页码: 12-15
Authors:  Wei, HY (Wei, H. Y.);  Cong, GW (Cong, G. W.);  Zhang, PF (Zhang, P. F.);  Hu, WG (Hu, W. G.);  Wu, JJ (Wu, J. J.);  Jiao, CM (Jiao, C. M.);  Liu, XL (Liu, X. L.);  Zhu, QS (Zhu, Q. S.);  Wang, ZG (Wang, Z. G.);  Wei, HY, Chinese Acad Sci, Inst Semicond, Key Lab Semicond Mat Sci, POB 912, Beijing 10083, Peoples R China. 电子邮箱地址: why@semi.ac.cn
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Nanostructure  
Effect of Al incorporation on the AlGaN growth by metalorganic chemical vapor deposition 期刊论文
APPLIED SURFACE SCIENCE, 2006, 卷号: 253, 期号: 5, 页码: 2452-2455
Authors:  Zhao, DG (Zhao, D. G.);  Liu, ZS (Liu, Z. S.);  Zhu, JJ (Zhu, J. J.);  Zhang, SM (Zhang, S. M.);  Jiang, DS (Jiang, D. S.);  Yang, H (Yang, Hui);  Liang, JW (Liang, J. W.);  Li, XY (Li, X. Y.);  Gong, HM (Gong, H. M.);  Zhao, DG, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. 电子邮箱地址: dgzhao@red.semi.ac.cn
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Al Incorporation  
Structural and optical properties of violet InGaN/AlInGaN light-emitting diodes grown by MOCVD 期刊论文
JOURNAL OF CRYSTAL GROWTH, 2006, 卷号: 295, 期号: 1, 页码: 40370
Authors:  Liu JP (Liu J. P.);  Shen GD (Shen G. D.);  Zhu JJ (Zhu J. J.);  Zhang SM (Zhang S. M.);  Jiang DS (Jiang D. S.);  Yang H (Yang H.);  Liu, JP, Beijing Univ Technol, Beijing Optoelect Technol Lab, Pingleyuan 100, Beijing 100022, Chaoyang Dist, Peoples R China. E-mail: jianpingliu76@hotmail.com
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Metal Organic Chemical Vapor Deposition  Violet Light-emitting Diodes  Alingan Quaternary Alloy  Quaternary Alingan Epilayers  Emission  Gan  
Effects of grain size on the mosaic tilt and twist in InN films grown on GaN by metal-organic chemical vapor deposition 期刊论文
APPLIED PHYSICS LETTERS, 2006, 卷号: 89, 期号: 9, 页码: Art.No.092114
Authors:  Wang H (Wang H.);  Huang Y (Huang Y.);  Sun Q (Sun Q.);  Chen J (Chen J.);  Wang LL (Wang L. L.);  Zhu JJ (Zhu J. J.);  Zhao DG (Zhao D. G.);  Zhang SM (Zhang S. M.);  Jiang DS (Jiang D. S.);  Wang YT (Wang Y. T.);  Yang H (Yang H.);  Wang, H, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. E-mail: wangh@red.semi.ac.cn
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X-ray-diffraction  Electron-transport  Epitaxial Gan  Band-gap  Dislocations  Sapphire  Aln  
Structural characterization of AlGaN/GaN superlattices by x-ray diffraction and Rutherford backscattering 期刊论文
SUPERLATTICES AND MICROSTRUCTURES, 2006, 卷号: 40, 期号: 3, 页码: 137-143
Authors:  Zhou SQ (Zhou Shengqiang);  Wu MF (Wu M. F.);  Yao SD (Yao S. D.);  Zhang BS (Zhang B. S.);  Yang H (Yang H.);  Zhou, SQ, Forschungszentrum Rossendorf EV, POB 51 01 19, D-01314 Dresden, Germany. E-mail: zhousq2000@yahoo.com;  sdyao@pku.edu.cn
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Nitride Semiconductors  Superlattice  Rutherford Backscattering/channeling  Transmission Electron Microscopy  X-ray Diffraction  Multiple-quantum Wells  Optical-properties  Ingan/gan  Strain  Interface  Growth  Gan  
Effects of edge dislocations and intentional Si doping on the electron mobility of n-type GaN films 期刊论文
APPLIED PHYSICS LETTERS, 2006, 卷号: 89, 期号: 11, 页码: Art.No.112106
Authors:  Zhao DG (Zhao D. G.);  Yang H (Yang Hui);  Zhu JJ (Zhu J. J.);  Jiang DS (Jiang D. S.);  Liu ZS (Liu Z. S.);  Zhang SM (Zhang S. M.);  Wang YT (Wang Y. T.);  Liang JW (Liang J. W.);  Zhao, DG, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. E-mail: dgzhao@red.semi.ac.cn
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X-ray-diffraction  Scattering  Growth  Layers  
Thermal lensing effect in ridge structure InGaN multiple quantum well laser diodes 期刊论文
JOURNAL OF APPLIED PHYSICS, 2006, 卷号: 100, 期号: 4, 页码: Art.No.046101
Authors:  Li DY (Li D. Y.);  Huang YZ (Huang Y. Z.);  Zhu JJ (Zhu J. J.);  Zhao DG (Zhao D. G.);  Liu ZS (Liu Z. S.);  Zhang SM (Zhang S. M.);  Ye XJ (Ye X. J.);  Chong M (Chong M.);  Chen LH (Chen L. H.);  Yang H (Yang H.);  Liang JW (Liang J. W.);  Li, DY, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect & Nanooptoelec, POB 912, Beijing 100083, Peoples R China. E-mail: dyli@red.semi.ac.cn
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Linewidth Enhancement Factor  Wave-guide Laser  Gan Substrate  Index  Temperature  Gain  
Effect of lightly Si doping on the minority carrier diffusion length in n-type GaN films 期刊论文
APPLIED PHYSICS LETTERS, 2006, 卷号: 88, 期号: 25, 页码: Art.No.252101
Authors:  Zhao DG (Zhao D. G.);  Jiang DS (Jiang D. S.);  Yang H (Yang Hui);  Zhu JJ (Zhu J. J.);  Liu ZS (Liu Z. S.);  Zhang SM (Zhang S. M.);  Liang JW (Liang J. W.);  Hao XP (Hao X. P.);  Wei L (Wei L.);  Li X (Li X.);  Li XY (Li X. Y.);  Gong HM (Gong H. M.);  Zhao, DG, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. E-mail: dgzhao@red.semi.ac.cn
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Yellow Luminescence  Electron-beam  Vacancies