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Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 12, 页码: Art.No.125007
Authors:  Liu, JQ (Liu, J. Q.);  Wang, JF (Wang, J. F.);  Qiu, YX (Qiu, Y. X.);  Guo, X (Guo, X.);  Huang, K (Huang, K.);  Zhang, YM (Zhang, Y. M.);  Hu, XJ (Hu, X. J.);  Xu, Y (Xu, Y.);  Xu, K (Xu, K.);  Huang, XH (Huang, X. H.);  Yang, H (Yang, H.);  Xu, K, Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Suzhou 215125, Peoples R China. 电子邮箱地址: kxu2006@sinano.ac.cn
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Thin-films