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The investigation on strain relaxation and double peaks in photoluminescence of InGaN/GaN MQW layers 期刊论文
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2009, 卷号: 42, 期号: 23, 页码: Art.No.235104
Authors:  Zhu, JH (Zhu, J. H.);  Wang, LJ (Wang, L. J.);  Zhang, SM (Zhang, S. M.);  Wang, H (Wang, H.);  Zhao, DG (Zhao, D. G.);  Zhu, JJ (Zhu, J. J.);  Liu, ZS (Liu, Z. S.);  Jiang, DS (Jiang, D. S.);  Qiu, YX (Qiu, Y. X.);  Yang, H (Yang, H.);  Zhu, JH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China. 电子邮箱地址: smzhang@red.semi.ac.cn
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Multiple-quantum Wells  
Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2009, 卷号: 24, 期号: 12, 页码: Art.No.125007
Authors:  Liu, JQ (Liu, J. Q.);  Wang, JF (Wang, J. F.);  Qiu, YX (Qiu, Y. X.);  Guo, X (Guo, X.);  Huang, K (Huang, K.);  Zhang, YM (Zhang, Y. M.);  Hu, XJ (Hu, X. J.);  Xu, Y (Xu, Y.);  Xu, K (Xu, K.);  Huang, XH (Huang, X. H.);  Yang, H (Yang, H.);  Xu, K, Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Suzhou 215125, Peoples R China. 电子邮箱地址: kxu2006@sinano.ac.cn
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Thin-films