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Tolerance analysis for incident angle of volume phase holographic grating used in optical channel performance monitor 会议论文
PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 3, Xian, PEOPLES R CHINA, AUG 18-22, 2004
作者:  Xin HL;  Li F;  Cao P;  He YJ;  Chen P;  Liu YL;  Xin HL Chinese Acad Sci Inst Semicond Res & Dev Ctr Optoelect POB 912 Beijing 100083 Peoples R China.
Adobe PDF(571Kb)  |  收藏  |  浏览/下载：1210/196  |  提交时间：2010/10/29
Ocpm  Vphg  Incident Angle  Tolerance  
Structural properties of polycrystalline silicon films formed by pulsed rapid thermal processing 会议论文
AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 507, SAN FRANCISCO, CA, APR 14-17, 1998
作者:  Wang YQ;  Liao XB;  Diao HW;  He J;  Ma ZX;  Yue GZ;  Shen SR;  Kong GL;  Zhao YW;  Li ZM;  Yun F;  Wang YQ Chinese Acad Sci Inst Semicond State Lab Surface Phys POB 912 Beijing 100083 Peoples R China.
Adobe PDF(958Kb)  |  收藏  |  浏览/下载：1186/287  |  提交时间：2010/10/29
Amorphous-silicon  Crystallization  Transistors  
JFET SOS devices: Processing and gamma radiation effects 会议论文
1998 5TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY PROCEEDINGS, BEIJING, PEOPLES R CHINA, OCT 21-23, 1998
作者:  Nie JP;  Liu ZL;  He ZJ;  Yu F;  Li GH;  Nie JP Chinese Acad Sci Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(209Kb)  |  收藏  |  浏览/下载：1343/242  |  提交时间：2010/10/29
Silicon  
The photon scanning tunneling microscope and its applications 会议论文
JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 15 (4), GUANGZHOU, PEOPLES R CHINA, AUG 29-SEP 02, 1995
作者:  Yao JE;  Guo N;  Gao S;  Wu SF;  Xia DK;  Shang GY;  Chu SC;  Li CJ;  He J;  Xu SH;  Yao JE Acad Sinica Beijing Lab Electron Microscopy POB 2724 Beijing 100080 Peoples R China.
Adobe PDF(1203Kb)  |  收藏  |  浏览/下载：1173/177  |  提交时间：2010/11/15
Photon Scanning Tunneling Microscope  Scanning Near-field Optical Microscope  Optical Microscopy