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Temporal Differential CMOS Image Sensor for Low-Light and High-Speed Applications 会议论文
International Symposium on Photoelectronic Detection and Imaging 2011 - Advances in Imaging Detectors and Applications, Beijing, PEOPLES R CHINA, 2011
作者:  Guan N (Guan Ning);  Zhang X (Zhang Xu);  Dong Z (Dong Zan);  Wang W (Wang Wei);  Gui Y (Gui Yun);  Han JQ (Han Jianqiang);  Wang Y (Wang Yuan);  Huang BJ (Huang Beiju);  Chen HD (Chen Hongda)
Adobe PDF(516Kb)  |  收藏  |  浏览/下载：1901/510  |  提交时间：2011/12/13
Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 91, RIMINI, ITALY, SEP 24-28, 2001
作者:  Zhao YW;  Sun NF;  Dong HW;  Jiao JH;  Zhao JQ;  Sun TN;  Lin LY;  Sun NF Hebei Semicond Res Inst POB 179-40 Shijiazhuang 050002 Hebei Peoples R China.
Adobe PDF(179Kb)  |  收藏  |  浏览/下载：1581/289  |  提交时间：2010/11/15
Indium Phosphide  Semi-insulating  Annealing  Picts  Photoluminescence  Semiinsulating Inp  Indium-phosphide  Fe  Photoluminescence  Temperature