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The impact of the stress induced by lateral spatial hole burning on the degradation of broad-area AlGaAs/GaAs laser diodes 期刊论文
JOURNAL OF APPLIED PHYSICS, 2012, 卷号: 112, 期号: 11, 页码: 113104
Authors:  Qiao YB (Qiao, Yanbin);  Feng SW (Feng, Shiwei);  Xiong C (Xiong, Cong);  Ma XY (Ma, Xiaoyu);  Zhu H (Zhu, Hui);  Guo CS (Guo, Chunsheng);  Wei GH (Wei, Guanghua)
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