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Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy 期刊论文
IEEE Electron Device Letters, 2013, 卷号: 34, 期号: 9, 页码: 1079-1081
Authors:  Li, Hao;  Zeng, Xiangbo;  Yang, Ping;  Zhang, Xiaodong;  Xie, Xiaobing;  Li, Jingyan;  Wang, Qiming
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