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Small-signal and large-signal performance test of high-speed optoelectronics devices 会议论文
SEMICONDUCTOR AND ORGANIC OPTOELECTRONIC MATERIALS AND DEVICES丛书标题: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE), Beijing, PEOPLES R CHINA, NOV 09-11, 2004
作者:  Zhu NH;  Chen C;  Sun JW;  Pun EYB;  Chung PS;  Zhu, NH, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, POB 912, Beijing 100083, Peoples R China.
Adobe PDF(403Kb)  |  收藏  |  浏览/下载：1407/396  |  提交时间：2010/03/29
Scattering Parameters