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A CMOS front-end circuit for SONET OC-96 receiver 会议论文
2006 INTERNATIONAL CONFERENCE ON COMMUNICATIONS CIRCUITS AND SYSTEMS PROCEEDINGS丛书标题: International Conference on Communications, Circuits and Systems, Guilin, PEOPLES R CHINA, JUN 25-28, 2006
作者:  Liu JB (Liu Jinbin);  Gu M (Gu Ming);  Chen HD (Chen Hongda);  Gao P (Gao Peng);  Liu, JB, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China.
Adobe PDF(4025Kb)  |  收藏  |  浏览/下载:1458/239  |  提交时间:2010/03/29
Transimpedance Amplifier  
Development of current-based microscopic defect analysis method using optical filling techniques for the defect study on heavily irradiated high-resistivity Si sensors/detectors 会议论文
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Beijing, PEOPLES R CHINA, SEP 13-19, 2005
作者:  Li, Z (Li, Z.);  Li, CJ (Li, C. J.);  Li, Z, Brookhaven Natl Lab, Upton, NY 11973 USA. 电子邮箱地址: zhengl@bnl.gov
Adobe PDF(175Kb)  |  收藏  |  浏览/下载:1348/373  |  提交时间:2010/03/29
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