Knowledge Management System Of Institute of Semiconductors,CAS
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| 当前检索式 | ((ALL：Point-defects)) |
| 限定条件 | ((收录类别：CPCI-S) AND (语种：英语)) |
| IEEE. 2 | China Natl Nat Sci F 1 | Electrochem Soc, Ele 1 |
| IEEE Electron Device 1 | IEEE, Electron Devic 1 | IEEE. Princeton Univ 1 |
| Mat Res Soc.; Akzo N 1 | SPIE Int Soc Opt Eng 1 |
