Knowledge Management System Of Institute of Semiconductors,CAS
分面浏览：出处 |
| 当前检索式 | ((ALL：X-ray-diffraction)) |
| 限定条件 | ((作者：172111-000585) AND (作者：172111-000653)) |
| JOURNAL OF PHYSICS D 3 | JOURNAL OF ALLOYS AN 2 | ACTA PHYSICA SINICA 1 |
| APPLIED PHYSICS LETT 1 | CHINESE PHYSICS LETT 1 | PHYSICA SCRIPTA 1 |
| SEMICONDUCTOR SCIENC 1 | 半导体学报 1 |
