SEMI OpenIR  > 中国科学院半导体研究所(2009年前)
二元判定图器件
吴南健; 陆江; 刘肃; 邝小飞
2005-10-05
Date Available2009-06-04 ; 2009-06-11
Subtype发明
Application Date2004-04-02
Language中文
Application NumberCN200410033307.8
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/2961
Collection中国科学院半导体研究所(2009年前)
Recommended Citation
GB/T 7714
吴南健,陆江,刘肃,等. 二元判定图器件[P]. 2005-10-05.
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200410033307.pdf(512KB) 限制开放--Application Full Text
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