SEMI OpenIR  > 半导体超晶格国家重点实验室
Single-photon property characterization of 1.3 mu m emissions from InAs/GaAs quantum dots using silicon avalanche photodiodes
Zhou, PY; Dou, XM; Wu, XF; Ding, K; Li, MF; Ni, HQ; Niu, ZC; Jiang, DS; Sun, BQ
2014
Source PublicationSCIENTIFIC REPORTS
Volume4Pages:3633
Subject Area半导体物理
Indexed BySCI
Language英语
Date Available2015-03-25
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26168
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Zhou, PY,Dou, XM,Wu, XF,et al. Single-photon property characterization of 1.3 mu m emissions from InAs/GaAs quantum dots using silicon avalanche photodiodes[J]. SCIENTIFIC REPORTS,2014,4:3633.
APA Zhou, PY.,Dou, XM.,Wu, XF.,Ding, K.,Li, MF.,...&Sun, BQ.(2014).Single-photon property characterization of 1.3 mu m emissions from InAs/GaAs quantum dots using silicon avalanche photodiodes.SCIENTIFIC REPORTS,4,3633.
MLA Zhou, PY,et al."Single-photon property characterization of 1.3 mu m emissions from InAs/GaAs quantum dots using silicon avalanche photodiodes".SCIENTIFIC REPORTS 4(2014):3633.
Files in This Item:
File Name/Size DocType Version Access License
Single-photon proper(967KB) 限制开放LicenseApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Zhou, PY]'s Articles
[Dou, XM]'s Articles
[Wu, XF]'s Articles
Baidu academic
Similar articles in Baidu academic
[Zhou, PY]'s Articles
[Dou, XM]'s Articles
[Wu, XF]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Zhou, PY]'s Articles
[Dou, XM]'s Articles
[Wu, XF]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.