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The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN
Li, X. J.; Zhao, D. G.; Jiang, D. S.; Liu, Z. S.; Chen, P.; Zhu, J. J.; Le, L. C.; Yang, J.; He, X. G.; Zhang, S. M.; Zhang, B. S.; Liu, J. P.; Yang, H.
2014
Source PublicationJOURNAL OF APPLIED PHYSICS
Volume116Issue:16Pages:163708
Subject Area光电子学
Indexed BySCI
Language英语
Date Available2015-03-19
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26024
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
Li, X. J.,Zhao, D. G.,Jiang, D. S.,et al. The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN[J]. JOURNAL OF APPLIED PHYSICS,2014,116(16):163708.
APA Li, X. J..,Zhao, D. G..,Jiang, D. S..,Liu, Z. S..,Chen, P..,...&Yang, H..(2014).The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN.JOURNAL OF APPLIED PHYSICS,116(16),163708.
MLA Li, X. J.,et al."The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN".JOURNAL OF APPLIED PHYSICS 116.16(2014):163708.
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