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Far-field pattern simulation and measurement for unidirectional-emission circular microlasers
Yong-Zhen Huang; Xiao-Meng Lv; Heng Long; Ling-Xiu Zou; Qi-Feng Yao; Yue-De Yang; Xin Jin; Ming-Ying Tang; Jin-Long Xiao; Yun Du
2013
Source PublicationProceedings of SPIE - The International Society for Optical Engineering
Volume8600Pages:86001I
Subject Area光电子学
Indexed ByEI
Language英语
Date Available2014-05-08
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24896
Collection集成光电子学国家重点实验室
Recommended Citation
GB/T 7714
Yong-Zhen Huang,Xiao-Meng Lv,Heng Long,et al. Far-field pattern simulation and measurement for unidirectional-emission circular microlasers[J]. Proceedings of SPIE - The International Society for Optical Engineering,2013,8600:86001I.
APA Yong-Zhen Huang.,Xiao-Meng Lv.,Heng Long.,Ling-Xiu Zou.,Qi-Feng Yao.,...&Yun Du.(2013).Far-field pattern simulation and measurement for unidirectional-emission circular microlasers.Proceedings of SPIE - The International Society for Optical Engineering,8600,86001I.
MLA Yong-Zhen Huang,et al."Far-field pattern simulation and measurement for unidirectional-emission circular microlasers".Proceedings of SPIE - The International Society for Optical Engineering 8600(2013):86001I.
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