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Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy
Li, Hao; Zeng, Xiangbo; Yang, Ping; Zhang, Xiaodong; Xie, Xiaobing; Li, Jingyan; Wang, Qiming
2013
Source PublicationIEEE Electron Device Letters
Volume34Issue:9Pages:1079-1081
Subject Area光电子学
Indexed BySCI
Language英语
Date Available2014-04-04
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/24656
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
Li, Hao,Zeng, Xiangbo,Yang, Ping,et al. Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy[J]. IEEE Electron Device Letters,2013,34(9):1079-1081.
APA Li, Hao.,Zeng, Xiangbo.,Yang, Ping.,Zhang, Xiaodong.,Xie, Xiaobing.,...&Wang, Qiming.(2013).Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy.IEEE Electron Device Letters,34(9),1079-1081.
MLA Li, Hao,et al."Determination of the Interface States in AmorphousCrystalline Silicon Using Surface Photovoltage Spectroscopy".IEEE Electron Device Letters 34.9(2013):1079-1081.
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