The photon scanning tunneling microscope and its applications

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	The photon scanning tunneling microscope and its applications
	Yao JE; Guo N; Gao S; Wu SF; Xia DK; Shang GY; Chu SC; Li CJ; He J; Xu SH; Yao JE Acad Sinica Beijing Lab Electron Microscopy POB 2724 Beijing 100080 Peoples R China.
	1997
会议名称	14th International Congress on X-ray Optics and Microanalysis (ICXOM)
会议录名称	JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 15 (4)
页码	621-628
会议日期	AUG 29-SEP 02, 1995
会议地点	GUANGZHOU, PEOPLES R CHINA
出版地	270 MADISON AVE, NEW YORK, NY 10016 USA
出版者	MARCEL DEKKER INC
ISSN	0733-4680
部门归属	acad sinica, beijing lab electron microscopy, beijing 100080, peoples r china; dalian univ technol, dept phys, dalian 116023, liaoning, peoples r china; acad sinica, inst semicond, beijing 100083, peoples r china
摘要	A simple photon scanning tunneling microscope (PSTM) is described. Its lateral resolution (similar to 10nm with a maximal scanning range of 10 mu m x 10 mu m ) is much better than that of a conventional optical microscope. Its principle, the fiber optic tip fabrication and PSTM images of different samples such as mica, HDPE and LiNbO3 are presented.
关键词	Photon Scanning Tunneling Microscope Scanning Near-field Optical Microscope Optical Microscopy
学科领域	半导体化学
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/15101
专题	中国科学院半导体研究所（2009年前）
通讯作者	Yao JE Acad Sinica Beijing Lab Electron Microscopy POB 2724 Beijing 100080 Peoples R China.
推荐引用方式 GB/T 7714	Yao JE,Guo N,Gao S,et al. The photon scanning tunneling microscope and its applications[C]. 270 MADISON AVE, NEW YORK, NY 10016 USA:MARCEL DEKKER INC,1997:621-628.

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